Micro-Epsilon - PRODUCT NEWS

 
 
Having difficulty measuring against shiny, mirrored or transparent surfaces? Micro-Epsilon's new displacement sensor the 1FD2400 is able to measure independently from surface reflection by using a unique con-focal chromatic' measurement principle. Machined metal, mirrored surfaces, silicon wafer~ glass, even matt rubber and textile materials can all be measured accurately. hicknesses of transparent materials can be measured from one side with one sensor Hole depth can be easily achieved as the sensor emitter and receiver is positioned in one axis, which eliminates shadowing. The system is designed to be an inline process tool with the capability of external triggering, enabling closed loop feedback and control. It can be easily integrated into special purpose machine tools, mechanical handling, robot positioning and much more. ________________________________________________________ For further information, please contact:- Chris Jones Micro-Epsilon UK Ltd. Telephone: +44(0)151 355 6070 Fax: +44(0)151 355 6075 Email: info@micro-epsilon.co.uk Website: www.micro-epsilon.co.uk March 2005
Home - Website - Search - Suppliers - Links - New Products - Catalogues - Magazines Problem Page - Applications - How they work - Tech Tips - Training - Events - Jobs - Register