Having difficulty measuring against shiny,
mirrored or transparent surfaces?
Micro-Epsilon's new displacement sensor the 1FD2400
is able to measure independently from surface reflection
by using a unique con-focal chromatic' measurement
principle.
Machined metal, mirrored surfaces, silicon wafer~ glass, even
matt rubber and textile materials can all be measured accurately.
hicknesses of transparent materials can be measured from one
side with one sensor Hole depth can be easily achieved as the
sensor emitter and receiver is positioned in one axis, which
eliminates shadowing.
The system is designed to be an inline process tool with the
capability of external triggering, enabling closed loop feedback
and control. It can be easily integrated into special purpose
machine tools, mechanical handling, robot positioning and
much more.
________________________________________________________
For further information, please contact:-
Chris Jones
Micro-Epsilon UK Ltd.
Telephone: +44(0)151 355 6070
Fax: +44(0)151 355 6075
Email: info@micro-epsilon.co.uk
Website: www.micro-epsilon.co.uk
March 2005
